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Author:

Ren, Jun (Ren, Jun.) | Zheng, Xiaorui (Zheng, Xiaorui.) | Tian, Zhiming (Tian, Zhiming.) | Li, Dan (Li, Dan.) | Wang, Pu (Wang, Pu.) | Jia, Baohua (Jia, Baohua.)

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EI Scopus SCIE

Abstract:

Giant third-order nonlinear absorption and refraction of electrochemical graphene oxide (EGO) film were investigated in the femtosecond regime using the single beam Z-scan technique. The excellent chemical stability of the EGO film under high-power illumination up to 400 mJ/cm(2) is demonstrated, which can be attributed to the low oxidation degree revealed by the optical and Raman spectroscopies. High and broadband linear transmission over 70% has been observed from the visible to the infrared range. The low-loss EGO film with giant third-order nonlinearity, excellent chemical stability, large-scale preparation and flexible integration has a great potential for high-power nonlinear optical applications. Published by AIP Publishing.

Keyword:

Author Community:

  • [ 1 ] [Ren, Jun]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Wang, Pu]Beijing Univ Technol, Inst Laser Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Ren, Jun]Swinburne Univ Technol, Fac Sci Engn & Technol, Ctr Microphoton, Hawthorn, Vic 3122, Australia
  • [ 4 ] [Zheng, Xiaorui]Swinburne Univ Technol, Fac Sci Engn & Technol, Ctr Microphoton, Hawthorn, Vic 3122, Australia
  • [ 5 ] [Jia, Baohua]Swinburne Univ Technol, Fac Sci Engn & Technol, Ctr Microphoton, Hawthorn, Vic 3122, Australia
  • [ 6 ] [Tian, Zhiming]Monash Univ, Dept Mat Sci & Engn, Clayton, Vic 3800, Australia
  • [ 7 ] [Li, Dan]Monash Univ, Dept Mat Sci & Engn, Clayton, Vic 3800, Australia

Reprint Author's Address:

  • [Jia, Baohua]Swinburne Univ Technol, Fac Sci Engn & Technol, Ctr Microphoton, Hawthorn, Vic 3122, Australia

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Source :

APPLIED PHYSICS LETTERS

ISSN: 0003-6951

Year: 2016

Issue: 22

Volume: 109

4 . 0 0 0

JCR@2022

ESI Discipline: PHYSICS;

ESI HC Threshold:175

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 21

SCOPUS Cited Count: 46

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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