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Abstract:
硅基雪崩光电探测器的器件性能与倍增层的掺杂浓度有着密切联系.研究了硅基雪崩光电探测器倍增层的掺杂浓度对雪崩击穿电压和光谱响应度等特性的影响.在硼的注入剂量由5.0×1012cm-2减小为2.5×1012 cm-2时,倍增层内电场强度逐渐降低,吸收区电场强度迅速增大,器件的雪崩击穿电压由16.3V迅速上升到203 V,而光谱响应在95%的击穿电压下,峰值响应波长由480 nm红移至800 nm,对应的响应度由11.2 A/W剧增到372.3 A/W.综合考虑光谱响应和雪崩击穿电压的影响,在硼注入剂量为3.5×1012cm 2时,可获得击穿电压为43.5V和响应度为342.5 A/W的器件模型,对实际器件的制备具有一定参考价值.
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半导体光电
ISSN: 1001-5868
Year: 2014
Issue: 6
Volume: 35
Page: 973-976
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 5
Chinese Cited Count:
30 Days PV: 1
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