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Abstract:
通孔插装焊点是元器件与电路板接合最为常见的方式,以传统的通孔插装焊点为研究对象,按照IPC-9701标准设计热循环试验,在不同周期对焊点进行金相分析,对其失效行为及机理进行了研究,并测试了焊点的热疲劳寿命.同时采用有限元数值计算,应用基于蠕变应变的寿命模型,计算了焊点的热疲劳寿命.所得的试验结果与理论计算基本吻合.
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焊接
ISSN: 1001-1382
Year: 2012
Issue: 12
Page: 38-42
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 4
Chinese Cited Count:
30 Days PV: 3
Affiliated Colleges: