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Author:

王欣欣 (王欣欣.) | 刘建萍 (刘建萍.) | 郭福 (郭福.) | 刘莉 (刘莉.) | 浮婵妮 (浮婵妮.)

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CQVIP PKU CSCD

Abstract:

利用高精度X射线检测设备分别对用Sn37Pb焊膏和Sn3.0Ag0.SCu焊膏组装的高密度LED灯板进行焊后和老化后的微空洞检测,观察了焊点的微空洞缺陷,并计算微空洞尺寸.结果表明:老化前微空洞面积与焊点面积比在10%~25%的,Sn3.0Ag0.5Cu焊点中约含25.5%,略大于Sn37Pb焊点的23.5%,且明显小于Sn3.0Ag0.5Cu焊点老化后的31.4%.两种焊点老化前后微空洞所占面积比都在<25%的合格范围内,但Sn3.0Ag0.5Cu焊点更易形成微空洞.

Keyword:

LED组装 X射线检测 焊点 空洞

Author Community:

  • [ 1 ] [王欣欣]北京工业大学
  • [ 2 ] [刘建萍]北京工业大学
  • [ 3 ] [郭福]北京工业大学
  • [ 4 ] [刘莉]北京利亚德光电股份有限公司
  • [ 5 ] [浮婵妮]北京利亚德光电股份有限公司

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Source :

电子元件与材料

ISSN: 1001-2028

Year: 2012

Issue: 1

Volume: 31

Page: 64-67

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: 3

Chinese Cited Count:

30 Days PV: 0

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