Indexed by:
Abstract:
利用高精度X射线检测设备分别对用Sn37Pb焊膏和Sn3.0Ag0.SCu焊膏组装的高密度LED灯板进行焊后和老化后的微空洞检测,观察了焊点的微空洞缺陷,并计算微空洞尺寸.结果表明:老化前微空洞面积与焊点面积比在10%~25%的,Sn3.0Ag0.5Cu焊点中约含25.5%,略大于Sn37Pb焊点的23.5%,且明显小于Sn3.0Ag0.5Cu焊点老化后的31.4%.两种焊点老化前后微空洞所占面积比都在<25%的合格范围内,但Sn3.0Ag0.5Cu焊点更易形成微空洞.
Keyword:
Reprint Author's Address:
Email:
Source :
电子元件与材料
ISSN: 1001-2028
Year: 2012
Issue: 1
Volume: 31
Page: 64-67
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: 3
Chinese Cited Count:
30 Days PV: 0
Affiliated Colleges: