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Author:

Guo Chun-Sheng (Guo Chun-Sheng.) | Shan Ni-Na (Shan Ni-Na.) | Feng Shi-Wei (Feng Shi-Wei.) (Scholars:冯士维) | Ma Wei-Dong (Ma Wei-Dong.)

Indexed by:

Scopus SCIE PKU CSCD

Abstract:

To correct the error in theoretical model of process stress accelerated test, a new calculation method is proposed The new method, based on computer-aided calculation, can significantly reduce the error of the model Theoretical data is calculated using both the novel model algorithm, which is the root test method, and the old model algorithm The results shows that the old model algorithm can generate errors of more than 13% m the activation energy, and of errors more than 150% in the extrapolated lifetimes (Q <= 1.0 ev), while the novel model algorithm generates errors in less than 1% in activation energy, and errors less than -4.1% in the extrapolated lifetime

Keyword:

process-stress theory model accelerated test error correction

Author Community:

  • [ 1 ] [Guo Chun-Sheng]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Shan Ni-Na]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Feng Shi-Wei]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Ma Wei-Dong]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Guo Chun-Sheng]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China

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Source :

ACTA PHYSICA SINICA

ISSN: 1000-3290

Year: 2010

Issue: 4

Volume: 59

Page: 2350-2355

1 . 0 0 0

JCR@2022

ESI Discipline: PHYSICS;

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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