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Author:

Zhang Lei (Zhang Lei.) | Cui Bifeng (Cui Bifeng.) | Guo Weiling (Guo Weiling.) | Wang Zhiqun (Wang Zhiqun.) | Shen Guangdi (Shen Guangdi.)

Indexed by:

EI Scopus SCIE

Abstract:

Transverse micro-stack semiconductor laser bars are put forward to improve the output optical power of semiconductor laser bars at low injection current. Micro-stack tunnel regeneration tri-active region laser structure was grown by metal organic chemical vapor deposition (MOCVD) and laser diode bars with 50% fill factors were fabricated. Experiments show that the insulated recesses strongly affect the properties of the bars. When the recess depth is less than 1.13 mu m, the bars do not work well. By optimizing the insulated recess depth, threshold current can be reduced to 7.05 A, the optical power exceeds 79 W under 50 A driving current and the slope efficiency reaches 1.81 W/A. (c) 2008 Elsevier Ltd. All rights reserved.

Keyword:

Transverse micro-stack Tunnel regeneration High power Weakly coupled Laser bar

Author Community:

  • [ 1 ] [Zhang Lei]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China
  • [ 2 ] [Cui Bifeng]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China
  • [ 3 ] [Guo Weiling]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China
  • [ 4 ] [Wang Zhiqun]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China
  • [ 5 ] [Shen Guangdi]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China
  • [ 6 ] [Zhang Lei]Beijing Inst Tracking & Telecommun Technol, Beijing 100094, Peoples R China

Reprint Author's Address:

  • [Zhang Lei]Beijing Univ Technol, Optoelect Technol Lab, Beijing 100022, Peoples R China

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Source :

MICROELECTRONICS JOURNAL

ISSN: 0026-2692

Year: 2008

Issue: 12

Volume: 39

Page: 1580-1582

2 . 2 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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