Abstract:
本文通过对TO252-5L(B)封装进行导率、框架热导率及PCB板热导率的变化与封装热阻之间的影响关系。为封装热有限元分析,得出粘片胶热导率、粘片胶厚度、EMC热阻的仿真分析及电子元器件散热优化提供参考思路。
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Year: 2012
Page: 531-532
Language: Chinese
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ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
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30 Days PV: 0
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