Abstract:
采用格构模型对电子封装焊锡接点的开裂过程进行了数值模拟,结果表明采用格构模型不但使用简单,而且预测结果与实际开裂模式基本吻合。
Keyword:
Reprint Author's Address:
Email:
Source :
Year: 2012
Page: 337-338
Language: Chinese
Cited Count:
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
Chinese Cited Count:
30 Days PV: 0
Affiliated Colleges: