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Author:

Mandracchia, B. (Mandracchia, B..) | Bianco, V. (Bianco, V..) | Wang, Z. (Wang, Z..) (Scholars:王湛) | Paturzo, M. (Paturzo, M..) | Ferraro, P. (Ferraro, P..)

Indexed by:

CPCI-S EI Scopus

Abstract:

We designed, realized, and tested a pocket module that allows performing off-axis Digital Holography microscopy with no need for an interferometer setup. A commercial plastic chip is engineered for the scope. Our strategy is moving complexity from the reconstruction algorithms and the external imaging apparatus to the chip itself, using custom optical components. We functionalized the chip with a photoresist grating and polymer lenses, to avoid the need for a reference arm as well as external optical components. Thanks to the single beam scheme, the system is robust against vibrations and the stability of fringe patterns implies enhanced portability.

Keyword:

Phase retrieval Holographic optical elements Scanning microscopy Digital holography Integrated optics devices Diffraction and gratings Microscopy

Author Community:

  • [ 1 ] [Mandracchia, B.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy
  • [ 2 ] [Bianco, V.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy
  • [ 3 ] [Wang, Z.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy
  • [ 4 ] [Paturzo, M.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy
  • [ 5 ] [Ferraro, P.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy
  • [ 6 ] [Wang, Z.]Beijing Univ Technol, Coll Appl Sci, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Bianco, V.]CNR, Inst Appl Sci & Intelligent Syst E Caianiello, Via Campi Flegrei 34, I-80078 Pozzuoli, NA, Italy

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Source :

SPECKLE 2018: VII INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY

ISSN: 0277-786X

Year: 2018

Volume: 10834

Language: English

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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