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Author:

Bie Xiaorui (Bie Xiaorui.) | Qin Fei (Qin Fei.) (Scholars:秦飞) | An Tong (An Tong.) | Zhao Jingyi (Zhao Jingyi.) | Fang Chao (Fang Chao.)

Indexed by:

CPCI-S

Abstract:

As the demand of power converter for higher power density is increasing, bonding wire failure of IGBT module becomes more severe. Accordingly, it is of great significance to investigate the reliability of bonding wire under operating condition for improving the reliability of IGBT module. In this paper, the finite element model of IGBT module was established, and a two-step indirect coupling electro-thermal-mechanical analysis was conducted to evaluate the wire bonding reliability of IGBT module under the power cylcing. The thermal-mechanical analysis results indicate that the maximum equivalent plastic strain occurs at the corner of the bonded interface between the outermost bonding wire and the chip, where the cracks may initiate and then propagate along the interface, which is consistent with the observations of experimental results. It suggests that the outermost bonding wire is more likely to fail.

Keyword:

IGBT Reliability Power cycling Wire bonding

Author Community:

  • [ 1 ] [Bie Xiaorui]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 2 ] [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 3 ] [An Tong]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 4 ] [Zhao Jingyi]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China
  • [ 5 ] [Fang Chao]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

Reprint Author's Address:

  • 秦飞

    [Qin Fei]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing, Peoples R China

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Source :

2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT)

Year: 2017

Page: 1396-1401

Language: English

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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