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Author:

Bergstedt, Edwin (Bergstedt, Edwin.) | Lin, Jiachun (Lin, Jiachun.) | Olofsson, Ulf (Olofsson, Ulf.)

Indexed by:

EI Scopus SCIE

Abstract:

Pitting and micropitting are the two main gear rolling contact fatigue modes. It is widely accepted that micropitting will lead to pitting; however, the relationship between pitting and micropitting life needs further investigation. In this work, micropitting and pitting tests were performed on an FZG back-to-back test rig using standard FZG PT-C and GF-C gears. The gear tooth profile change due to micropitting and pitting damage was measured in situ in the gearbox using a profilometer after each test. The gear surface roughness parameters were calculated from the measured tooth profile. A Gaussian low pass filter with cut off length lambda c=0.8 mm was applied to the measured tooth profile to obtain the waviness. The calculated roughness parameters and the obtained tooth profile with waviness for each test were imported into the KISSsoft software to calculate the contact stress and specific film thickness at the corresponding load stage. Experimental results show that smooth gear surface can reduce or even avoid micropitting damage, but could lead to a reduction in pitting life.

Keyword:

pitting micropitting roughness waviness FZG

Author Community:

  • [ 1 ] [Bergstedt, Edwin]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 2 ] [Olofsson, Ulf]KTH Royal Inst Technol, Dept Machine Design, Stockholm, Sweden
  • [ 3 ] [Lin, Jiachun]Beijing Univ Technol, Dept Instrument Sci & Technol, Beijing, Peoples R China

Reprint Author's Address:

  • [Lin, Jiachun]Beijing Univ Technol, Dept Instrument Sci & Technol, Beijing, Peoples R China

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Related Keywords:

Source :

PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART C-JOURNAL OF MECHANICAL ENGINEERING SCIENCE

ISSN: 0954-4062

Year: 2020

Issue: 24

Volume: 234

Page: 4953-4961

2 . 0 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:115

Cited Count:

WoS CC Cited Count: 16

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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