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Author:

Wang Jinhui (Wang Jinhui.) | Wu Wuchen (Wu Wuchen.) (Scholars:吴武臣) | Yuan Ying (Yuan Ying.) | Hu Xiaoling (Hu Xiaoling.) | Gong Na (Gong Na.)

Indexed by:

CPCI-S

Abstract:

A model for analyzing and optimizing the active power, the leakage power and the delay of the domino OR gates with the sleep transistor based on wavelet neural networks in 45 nm CMOS technology is proposed. By studying the impact of the sleep transistor, the model can successfully forecast the nonlinear changing of the active power, the leakage power and the delay of the different inputs domino OR gates. The simulation results for verification indicate that the forecasting model can be well applied in VLSI design with accuracy ratio of more than 90%(1).

Keyword:

domino OR gate power delay WNN

Author Community:

  • [ 1 ] [Wang Jinhui]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China
  • [ 2 ] [Wu Wuchen]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China
  • [ 3 ] [Yuan Ying]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China
  • [ 4 ] [Hu Xiaoling]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Wang Jinhui]Beijing Univ Technol, VLSI, Beijing 100124, Peoples R China

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Source :

2009: 8TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-6

Year: 2009

Page: 1578-1581

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

Affiliated Colleges:

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