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Author:

Zhang, Guangchen (Zhang, Guangchen.) | Feng, Shiwei (Feng, Shiwei.) (Scholars:冯士维) | Wang, Lu (Wang, Lu.) | Xie, Xuesong (Xie, Xuesong.) | Gao, Lichao (Gao, Lichao.) | Meng, Haijie (Meng, Haijie.)

Indexed by:

CPCI-S

Abstract:

The reliability of power LEDs has strong dependence on successful package thermal management. In this paper, heating response curves of LEDs were recorded by the temperature sensitive parameter (TSP) method and fast-switching circuit techniques. It provided a novel method to analyze thermal resistance composition of power LED's packaging. Cover-and-block method was presented to provide a correction to the apparent thermal resistance of optical devices, and an electrical method to obtain radiant efficiency was also put forward.

Keyword:

packaged power LED thermal resistance reliability radiant efficiency

Author Community:

  • [ 1 ] [Zhang, Guangchen]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Feng, Shiwei]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Wang, Lu]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Xie, Xuesong]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Gao, Lichao]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Meng, Haijie]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

Reprint Author's Address:

  • [Zhang, Guangchen]Beijing Univ Technol, Sch Elect Informat & Control Engn, Beijing 100124, Peoples R China

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Source :

2008 9TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1-4

Year: 2008

Page: 1203-1206

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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