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Author:

Li, Hengtao (Li, Hengtao.) | Liu, Xiucheng (Liu, Xiucheng.) (Scholars:刘秀成) | Wu, Bin (Wu, Bin.) | He, Cunfu (He, Cunfu.) (Scholars:何存富)

Indexed by:

EI Scopus SCIE

Abstract:

The two-step strategy for 3D reconstruction of complex defects was updated by combining the magnetic field disturbance (MFD) with magnetic flux leakage (MFL) measurement methods. Firstly, the plane-scanned MFD imaging was employed to achieve high-accuracy reconstruction of the opening outlines of complex defects. Secondly, the finite element simulation model of the defect with the recognized opening outline was established as the forward model for depth profile inversion with the particle swarm optimization algorithm. The performances of the conventional MFL-based and updated strategies were carefully compared through finite element simulation. The results proved that the updated method combining MFD signals with MFL signals had the better performance in accurate 3D reconstruction of complex defects than the conventional MFL-based inversion strategy, displaying smaller errors in opening outline, peak depth and the profile. Experimental results confirmed that the updated strategy could accurately reconstruct the 3D shape of 8-shaped defect and rectangular defect with rounded corners.

Keyword:

particle swarm optimization ux leakage magnetic field disturbance 3D reconstruction complex defect magnetic &#64258

Author Community:

  • [ 1 ] [Li, Hengtao]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Xiucheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 3 ] [Wu, Bin]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 4 ] [He, Cunfu]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China
  • [ 5 ] [Li, Hengtao]Baoji Univ Arts & Sci, Sch Mech Engn, Baoji 721016, Peoples R China

Reprint Author's Address:

  • 刘秀成

    [Liu, Xiucheng]Beijing Univ Technol, Fac Mat & Mfg, Beijing 100124, Peoples R China

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2021

Issue: 7

Volume: 32

2 . 4 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:87

JCR Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 10

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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