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Author:

白天旭 (白天旭.) | 张小玲 (张小玲.) | 谢雪松 (谢雪松.) | 王伟岩 (王伟岩.) | 电子产品可靠性与环境试验 (电子产品可靠性与环境试验.)

Indexed by:

CQVIP

Abstract:

用于电子加速器的串联二极管退化问题研究

Keyword:

退化 缺陷 串联二极管 欧姆接触 理想因子

Author Community:

  • [ 1 ] 北京工业大学信息学部,北京100124

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Source :

白天旭

ISSN: 1672-5468

Year: 2021

Issue: 1

Volume: 39

Page: 52-56

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count: -1

30 Days PV: 1

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