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Author:

Song, D (Song, D.) | Lu, CZ (Lu, CZ.) | Cai, XD (Cai, XD.)

Indexed by:

CPCI-S

Abstract:

A new microwave device model is brought out and simulated, which is called TI-PHEMT. The maximum extrinsic transconductance at high temperature increases significantly and therefore the microwave performance of HEMT at high temperature is increased. A new concept "Temperature Injection" is put forward to explain the reason.

Keyword:

GaAs high temperature characteristic TI-PHEMT

Author Community:

  • [ 1 ] Beijing Univ Technol, Sch Elec Info & Auto, Beijing 100022, Peoples R China

Reprint Author's Address:

  • [Song, D]Beijing Univ Technol, Sch Elec Info & Auto, Beijing 100022, Peoples R China

Email:

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Source :

2004 4th INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY PROCEEDINGS

Year: 2004

Page: 531-535

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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