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Author:

齐浩淳 (齐浩淳.) | 吕长志 (吕长志.) | 张小玲 (张小玲.) | 谢雪松 (谢雪松.)

Keyword:

failure truncated testing accelerating life failure mechanism sensitive parameters

Author Community:

  • [ 1 ] [齐浩淳]北京工业大学
  • [ 2 ] [吕长志]北京工业大学
  • [ 3 ] [张小玲]北京工业大学
  • [ 4 ] [谢雪松]北京工业大学

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Source :

半导体学报

Year: 2013

Issue: 6

Page: 85-90

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count: -1

Chinese Cited Count:

30 Days PV: 1

Affiliated Colleges:

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