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Author:

Wang, Juan (Wang, Juan.) | Wang, Zipeng (Wang, Zipeng.) | Shi, Kaibo (Shi, Kaibo.) | Jia, Fujin (Jia, Fujin.) | Ding, Kui (Ding, Kui.)

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Abstract:

This paper focuses on the stochastic passivity problem of stochastic memristor-based complex valued neural networks with two different types of time-delays and reaction-diffusion terms by sampled-data control strategy. Different from the existing sampled-data strategies, this paper develops spatial and temporal point sampling, namely, only a finite number of points in space or time are sampled. By introducing two different Lyapunov functional and employing techniques such as Wirtinger's integral inequality, Jensen's inequality and Young's inequality, etc., two different sufficient conditions for the stochastic passivity of the system are established. Prominently, the condition quantitatively reveals the relationship between the upper and lower bounds of the sampling interval at spatial and temporal points. Finally, a numerical example is given to verify the rationality of the proposed method. Notice, compared with a large number of results of real-valued reaction-diffusion neural networks, the research results of sampled-data controlled complex-valued reaction-diffusion neural networks have not appeared so far, and this work is the first attempt to fill in the gaps in this topic. (c) 2022 The Franklin Institute. Published by Elsevier Ltd. All rights reserved.

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Author Community:

  • [ 1 ] [Wang, Juan]Nanjing Univ Finance & Econ, Sch Appl Math, Nanjing 210023, Jiangsu, Peoples R China
  • [ 2 ] [Wang, Zipeng]Beijing Univ Technol, Fac Informat & Technol, Beijing 100124, Peoples R China
  • [ 3 ] [Shi, Kaibo]Chengdu Univ, Sch Elect Informat & Elect Engn, Chengdu 610106, Peoples R China
  • [ 4 ] [Jia, Fujin]Anhui Univ, Sch Elect Engn & Automat, Hefei 230601, Peoples R China
  • [ 5 ] [Ding, Kui]Hunan Normal Univ, Sch Math & Stat, Key Lab HPC SIP, MOE, Changsha 410081, Hunan, Peoples R China

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Source :

JOURNAL OF THE FRANKLIN INSTITUTE-ENGINEERING AND APPLIED MATHEMATICS

ISSN: 0016-0032

Year: 2022

Issue: 18

Volume: 359

Page: 11108-11134

4 . 1

JCR@2022

4 . 1 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:49

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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