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Author:

Tu, Jie (Tu, Jie.) | Fang, Yue-Wen (Fang, Yue-Wen.) | Lu, Yue (Lu, Yue.) | Li, Hangren (Li, Hangren.) | Xi, Guoqiang (Xi, Guoqiang.) | Ding, Jiaqi (Ding, Jiaqi.) | Liu, Xudong (Liu, Xudong.) | Liu, Xiuqiao (Liu, Xiuqiao.) | Yang, Qianqian (Yang, Qianqian.) | Tian, Jianjun (Tian, Jianjun.) | Zhang, Linxing (Zhang, Linxing.)

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Scopus SCIE

Abstract:

Strain engineering is an important method to control the structure and properties of functional thin films. Here, a new method to induce chemical strain through controllable substrate strain is proposed, which was first applied to double-perovskite thin films. We significantly improved the ferroelectricity of BiSmFe2O6-delta double-perovskite thin films to similar to 4.80 mu C/cm(2), approximately improved six times. The value is more excellent than that of the orthorhombic double-perovskite ferroelectric systems. Synchrotron-based x-ray diffraction and spherical aberration-corrected scanning transmission electron microscopy show that tensile strain can change the epitaxial growth mode and increase the lattice volume. Meanwhile, first-principles density functional theory calculations show that the tensile strain reduces the formation energy of oxygen vacancy. The increased oxygen vacancies can induce a large negative chemical pressure of -7.69 GPa imposed on the thin films on SrTiO3 substrates. The existence of more oxygen vacancies in the Fe-O octahedra of the thin films drives Fe ions away from their high-symmetrical central position, leading to the improvement of ferroelectricity. In addition, the large polarization and oxygen vacancy migration promote the improved functional properties of the thin films, such as large resistive switching (10(3) times). This strategy and approach will effectively promote the further application of the novel orthorhombic rare-earth double-perovskite devices.

Keyword:

Author Community:

  • [ 1 ] [Tu, Jie]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 2 ] [Li, Hangren]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 3 ] [Xi, Guoqiang]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 4 ] [Ding, Jiaqi]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 5 ] [Liu, Xudong]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 6 ] [Liu, Xiuqiao]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 7 ] [Yang, Qianqian]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 8 ] [Tian, Jianjun]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 9 ] [Zhang, Linxing]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China
  • [ 10 ] [Fang, Yue-Wen]Univ Basque Country UPV EHU, Fis Aplikatua Saila, Gipuzkoako Ingeniaritza Eskola, Europa Plaza 1, Donostia San Sebastian 20018, Spain
  • [ 11 ] [Fang, Yue-Wen]Univ Basque Country, Ctr Fis Mat, CSIC, Manuel Lardizabal Pasealekua 5, Donostia San Sebastian 20018, Spain
  • [ 12 ] [Lu, Yue]Beijing Univ Technol, Fac Mat & Mfg, Beijing Key Lab Microstruct & Properties Solids, Beijing 100124, Peoples R China
  • [ 13 ] [Ding, Jiaqi]Hunan Univ, Sch Phys & Elect, Key Lab Micro Nano Optoelect Devices, Minist Educ, Changsha 410082, Peoples R China

Reprint Author's Address:

  • [Zhang, Linxing]Univ Sci & Technol Beijing, Inst Adv Mat Technol, Beijing 100083, Peoples R China

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Source :

APPLIED PHYSICS REVIEWS

ISSN: 1931-9401

Year: 2024

Issue: 1

Volume: 11

1 5 . 0 0 0

JCR@2022

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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