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Author:

Aziz, Gohar (Aziz, Gohar.) | Hayat, Anwer (Hayat, Anwer.) | Iqbal, Naeem (Iqbal, Naeem.) | Zhai, Tianrui (Zhai, Tianrui.)

Indexed by:

EI Scopus

Abstract:

This research explores the interaction between silver films and dispersed silver nanowires (Ag NWs) in the context of generating random laser emission. To achieve random lasing, we use a mixture of Rhoda mine B (RhB) dye and a polyvinyl alcohol (PVA) matrix as the gain medium. The combination of silver components plays a crucial role in trapping and controlling light. The surface characteristics of the film, including its roughness and the interplay between localized and extended surface plasmons significantly affect the performance of the random laser (RL). The laser's threshold is closely linked to the thickness of the film, which is influenced by its surface roughness. Additionally, variations in film thickness lead to wavelength modulation, ranging from 597 nm to 606 nm, primarily due to the reabsorption of RhB. Moreover, this research demonstrates the intriguing capability to tune emission wavelengths in response to temperature changes, promising precise wavelength control for plasmonic devices and potential applications. © 2024 Institute of Physics Publishing. All rights reserved.

Keyword:

Rhodium compounds Laser beams Surface plasmons Surface roughness Silver Plasmonics

Author Community:

  • [ 1 ] [Aziz, Gohar]Institute of Information Photonic Technology, College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Hayat, Anwer]College of Optical Science and Engineering, Zhejiang University, Hangzhou, China
  • [ 3 ] [Iqbal, Naeem]Institute of Information Photonic Technology, College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Zhai, Tianrui]Institute of Information Photonic Technology, College of Applied Sciences, Beijing University of Technology, Beijing; 100124, China

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ISSN: 1742-6588

Year: 2024

Issue: 1

Volume: 2729

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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