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Author:

Jia, Jing (Jia, Jing.) | Feng, Shiwei (Feng, Shiwei.) (Scholars:冯士维) | Deng, Bing (Deng, Bing.) | Meng, Qinghui (Meng, Qinghui.) | Zhang, Yamin (Zhang, Yamin.)

Indexed by:

EI Scopus PKU CSCD

Abstract:

This article presents a quick approach to measure the thermal resistance of PCB in vacuum based on the relationship of temperature and Schottky junction voltage drop. Once the steady heating curve of SiC diode is obtained, the temperature characteristic of small current is applied to determine the thermal resistance of PCB. The transfer heat performance of PCB at different coverage Cu and different thermal via diameter is studied. The results show that the thermal resistance of PCB is found to decrease with the increasing coverage Cu. Thermal via placed on the PCB is significant to reduce the thermal resistance of PCB under constant coverage Cu. And the thermal resistance of PCB reduces with the increasing thermal via diameter. The finite element ANSYS software simulates the PCB temperature. The PCB temperature is consistent with the experimental results.

Keyword:

Silicon carbide Heat losses Organic pollutants Heat resistance Silicon compounds Heat transfer performance Polychlorinated biphenyls

Author Community:

  • [ 1 ] [Jia, Jing]Beijing University of Technology, Beijing; 100124, China
  • [ 2 ] [Feng, Shiwei]Beijing University of Technology, Beijing; 100124, China
  • [ 3 ] [Deng, Bing]Beijing University of Technology, Beijing; 100124, China
  • [ 4 ] [Meng, Qinghui]Beijing University of Technology, Beijing; 100124, China
  • [ 5 ] [Zhang, Yamin]Beijing University of Technology, Beijing; 100124, China

Reprint Author's Address:

  • [jia, jing]beijing university of technology, beijing; 100124, china

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Source :

Transactions of China Electrotechnical Society

ISSN: 1000-6753

Year: 2014

Issue: 9

Volume: 29

Page: 239-244

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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