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Author:

Yang, Guang (Yang, Guang.) | Qin, Fei (Qin, Fei.) | Shi, Ge (Shi, Ge.) | Dai, Yanwei (Dai, Yanwei.) (Scholars:代岩伟)

Indexed by:

CPCI-S EI Scopus

Abstract:

In order to improve the low temperature co-fired ceramic (LTCC) as the substrate of RF components in the work of high temperature problem, this paper aims to modify the internal structure and materials of T/R components, with the goal of improving the high-temperature working environment of T/R component chips. By doing so, it hopes to modify the heat transfer path of chips and the thermal conductivity of LTCC substrates, which will improve the heat dissipation performance of LTCC RF System-in-Package (SiP) components. Simulation is carried out using ICEPAK finite element software to simulate the model with increasing heat transfer path and increasing thermal conductivity of the structure. It is found that increasing the heat transfer path can effectively reduce the temperature of the TR component chip during operation, and the heat dissipation effect is improved less after further improving the thermal conductivity of the structure.

Keyword:

Numerical simulation Thermal resistance LTCC T/R components

Author Community:

  • [ 1 ] [Yang, Guang]Beijing Univ Technol, Sch Math, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 2 ] [Qin, Fei]Beijing Univ Technol, Sch Math, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 3 ] [Dai, Yanwei]Beijing Univ Technol, Sch Math, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China
  • [ 4 ] [Shi, Ge]Chinese Acad Sci, Aerosp Informat Res Inst, Beijing, Peoples R China

Reprint Author's Address:

  • [Qin, Fei]Beijing Univ Technol, Sch Math, Inst Elect Packaging Technol & Reliabil, Beijing, Peoples R China

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Source :

2024 25TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, ICEPT

ISSN: 2836-9734

Year: 2024

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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