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Author:

Zhang, Yu (Zhang, Yu.) | Deng, Xi (Deng, Xi.) | Yan, Jun (Yan, Jun.) | Su, Hang (Su, Hang.) | Gao, Hongyu (Gao, Hongyu.)

Indexed by:

EI Scopus

Abstract:

Android Auto is designed to enhance the driving experience by extending dashboards of cars with smartphones' functionalities, among which an essential one is the message flow via notification mechanism. This paper investigates the quality of current compatible apps, and locates two main error-prone points. The study begins with manually designed black-box testing models including finite state machine and combinatorial input model according to safety requirements, and extracts testing suites from them. The tests are executed on 17 popular apps and reveal dozens of defects that might result in safety risks or inferior driving experiences. These defects are manually inspected and organized into several patterns. The experience and lessons from this empirical study are helpful to the detailed design and implementation of messaging modules. © 2019 IEEE.

Keyword:

Black-box testing Safety testing Android (operating system) Defects Reengineering

Author Community:

  • [ 1 ] [Zhang, Yu]College of Computer Science, Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 2 ] [Deng, Xi]State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, China
  • [ 3 ] [Deng, Xi]University of Chinese Academy of Sciences, Beijing, China
  • [ 4 ] [Yan, Jun]State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, China
  • [ 5 ] [Yan, Jun]University of Chinese Academy of Sciences, Beijing, China
  • [ 6 ] [Su, Hang]College of Computer Science, Faculty of Information Technology, Beijing University of Technology, Beijing, China
  • [ 7 ] [Gao, Hongyu]College of Computer Science, Faculty of Information Technology, Beijing University of Technology, Beijing, China

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Year: 2019

Page: 559-563

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 3

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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