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Author:

Hu, Dongqing (Hu, Dongqing.) | Tang, Yun (Tang, Yun.) | Jia, Yunpeng (Jia, Yunpeng.) | Wu, Yu (Wu, Yu.)

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EI Scopus

Abstract:

A novel n-MOSFET structure with P-type island in the buffer layer is proposed and simulation studies have been performed in this paper. Simulation results show that the peak current induced by heavy ions can be reduced owing to field modification effects of P-type island. © 2018 EPE Association.

Keyword:

Power electronics MOSFET devices Heavy ions Buffer layers Failure (mechanical)

Author Community:

  • [ 1 ] [Hu, Dongqing]Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing, China
  • [ 2 ] [Tang, Yun]Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing, China
  • [ 3 ] [Jia, Yunpeng]Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing, China
  • [ 4 ] [Wu, Yu]Beijing University of Technology, 100 Pingleyuan, Chaoyang District, Beijing, China

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Year: 2018

Language: English

Cited Count:

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 3

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