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Author:

Li, Songyu (Li, Songyu.) | Chen, Xiaoqing (Chen, Xiaoqing.) | Liu, Famin (Liu, Famin.) | Chen, Yongfeng (Chen, Yongfeng.) | Liu, Beiyun (Liu, Beiyun.) | Deng, Wenjie (Deng, Wenjie.) | An, Boxing (An, Boxing.) | Chu, Feihong (Chu, Feihong.) | Zhang, Guoqing (Zhang, Guoqing.) | Li, Shanlin (Li, Shanlin.) | Li, Xuhong (Li, Xuhong.) | Zhang, Yongzhe (Zhang, Yongzhe.) (Scholars:张永哲)

Indexed by:

EI Scopus SCIE

Abstract:

Transition metal dichalcogenides (TMDs) are a category of promising two-dimensional (2D) materials for the optoelectronic devices, and their unique characteristics include tunable band gap, nondangling bonds as well as compatibility to large-scale fabrication, for instance, chemical vapor deposition (CVD). MoS2 is one of the first TMDs that is well studied in the photodetection area widely. However, the low photoresponse restricts its applications in photo-detectors unless the device is applied with ultrahigh source-drain voltage (V-DS) and gate voltage (V-Gs). In this work, the photoresponse of a MoS2 photodetector was improved by a chemical in situ doping method using gold chloride hydrate. The responsivity and specific detectivity were increased to 99.9 A/W and 9.4 x 10(12) Jones under low V-DS (0.1 V) and V-Gs (0 V), which are 14.6 times and 4.8 times higher than those of a pristine photodetector, respectively. The photoresponse enhancement results from chlorine n-type doping in CVD MoS2 which reduces the trapping of photoinduced electrons and promotes the photogating effect. This novel doping strategy leads to great applications of high-performance MoS2 photodetectors potentially and opens a new avenue to enhance photoresponse for other 2D materials.

Keyword:

photogating effect chemical vapor deposition (CVD) MoS2 in situ n-type doping photodetector

Author Community:

  • [ 1 ] [Li, Songyu]Beihang Univ, Sch Phys & Nucl Energy Engn, Beijing 100191, Peoples R China
  • [ 2 ] [Liu, Famin]Beihang Univ, Sch Phys & Nucl Energy Engn, Beijing 100191, Peoples R China
  • [ 3 ] [Li, Xuhong]Beihang Univ, Sch Phys & Nucl Energy Engn, Beijing 100191, Peoples R China
  • [ 4 ] [Li, Songyu]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 5 ] [Chen, Xiaoqing]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 6 ] [Chen, Yongfeng]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 7 ] [Liu, Beiyun]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 8 ] [Deng, Wenjie]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 9 ] [An, Boxing]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 10 ] [Li, Xuhong]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 11 ] [Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China
  • [ 12 ] [Chu, Feihong]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 13 ] [Zhang, Guoqing]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 14 ] [Li, Shanlin]Beijing Univ Technol, Inst Microstruct & Property Adv Mat, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 张永哲

    [Liu, Famin]Beihang Univ, Sch Phys & Nucl Energy Engn, Beijing 100191, Peoples R China;;[Zhang, Yongzhe]Beijing Univ Technol, Coll Mat Sci & Engn, Minist Educ, Key Lab Adv Funct Mat, Beijing 100124, Peoples R China

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Source :

ACS APPLIED MATERIALS & INTERFACES

ISSN: 1944-8244

Year: 2019

Issue: 12

Volume: 11

Page: 11636-11644

9 . 5 0 0

JCR@2022

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:211

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 105

SCOPUS Cited Count: 103

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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