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Author:

Fu, Qiang (Fu, Qiang.) | Zhang, Wan-Rong (Zhang, Wan-Rong.) | Jin, Dong-Yue (Jin, Dong-Yue.) | Xie, Hong-Yun (Xie, Hong-Yun.) | Xin, Zhao (Xin, Zhao.) | Wang, Ren-Qing (Wang, Ren-Qing.)

Indexed by:

EI Scopus

Abstract:

Based on the electro-thermal feedback model for multi-finger power SiGe heterojunction bipolar transistor (SiGe HBT), this article analyzes the effect of base heavy doping on thermal characteristic of SiGe HBT. Because of the effect of base heavy doping, SiGe HBT will produce bandgap narrowing which decreases the collector current density and affects the device thermal distribution. By analyzing the thermal characteristic of multi-finger spacing SiGe HBT, we find that increasing base doping can decrease the current density and the temperature of emitter finger, which suppress the emitter finger thermoelectric positive feedback and improve the device thermal stability. © 2011 IEEE.

Keyword:

Si-Ge alloys Feedback Heterojunction bipolar transistors Heterojunctions

Author Community:

  • [ 1 ] [Fu, Qiang]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Zhang, Wan-Rong]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Jin, Dong-Yue]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Xie, Hong-Yun]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 5 ] [Xin, Zhao]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Wang, Ren-Qing]College of Electronic Information and Control Engineering, Beijing University of Technology, Beijing, 100124, China

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Source :

Year: 2011

Page: 1365-1367

Language: English

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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