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Author:

Zuo, Lei (Zuo, Lei.) | Hou, Ligang (Hou, Ligang.) | Wu, Wuchen (Wu, Wuchen.) (Scholars:吴武臣) | Wang, Jinhui (Wang, Jinhui.) | Geng, Shuqin (Geng, Shuqin.)

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EI Scopus

Abstract:

A new method of analog IC fault diagnosis is proposed in this paper, which is based on wavelet neural network ensemble (WNNE) technique and Adaboost algorithm. This makes the way of the directory be of use in fault, and enhances the validity of the fault diagnosis. Using wavelet decomposition as a tool for extracting feature, Then, after training the WNNE by faulty feature vectors, the fault diagnosis of a radar scanning circuit is implemented with this new method. The simulation results show that the new method is more effective than the traditional wavelet neural network (WNN) method. © 2009 Springer Berlin Heidelberg.

Keyword:

Failure analysis Timing circuits Analog integrated circuits Adaptive boosting Fault detection Neural networks Wavelet decomposition

Author Community:

  • [ 1 ] [Zuo, Lei]VLSI and System Lab, Beijing University of Technology, Beijing 100022, China
  • [ 2 ] [Hou, Ligang]VLSI and System Lab, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Wu, Wuchen]VLSI and System Lab, Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Wang, Jinhui]VLSI and System Lab, Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Geng, Shuqin]VLSI and System Lab, Beijing University of Technology, Beijing 100022, China

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ISSN: 0302-9743

Year: 2009

Issue: PART 3

Volume: 5553 LNCS

Page: 772-779

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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