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Author:

Liu, Zenghua (Liu, Zenghua.) (Scholars:刘增华) | Yao, Jiufu (Yao, Jiufu.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Li, Liming (Li, Liming.) | Liu, Xiucheng (Liu, Xiucheng.) (Scholars:刘秀成) | Wu, Bin (Wu, Bin.) (Scholars:吴斌)

Indexed by:

EI Scopus SCIE

Abstract:

To reduce the effects of surface characteristics of materials and background noise of a magnetic excitation field, a new sensor with magnetic shielding was developed for eddy-current (EC) testing. Based on the analysis of EC theory, the performances of different cores, including air core, solid cylindrical ferrite core, hollow cylindrical ferrite core, and magnetic shielding ferrite core, were analyzed. The simulation results show that the magnetic shielding core can increase the EC density in the test material. External magnetic field shielding can effectively improve the defects' detection sensitivity and the detection depth of subsurface defects. According to the simulation results of finite-element excitation, a bidirectional-excitation EC sensor with magnetic shielding was prepared and optimized according to the orthogonal experiment. Finally, the experimental results show that it can effectively detect the notch defects of a 10-mm-thick stainless steel plate surface at a distance of 7 mm. A linear relationship was observed between the change of impedance amplitude, phase difference, and depth of subsurface defects.

Keyword:

stainless steel orthogonal optimization subsurface defect Bidirectional excitation magnetic shielding

Author Community:

  • [ 1 ] [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 2 ] [Yao, Jiufu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 3 ] [He, Cunfu]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 4 ] [Li, Liming]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 5 ] [Liu, Xiucheng]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China
  • [ 6 ] [Wu, Bin]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

Reprint Author's Address:

  • 刘增华

    [Liu, Zenghua]Beijing Univ Technol, Coll Mech Engn & Appl Elect Technol, Beijing 100124, Peoples R China

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Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2018

Issue: 15

Volume: 18

Page: 6203-6216

4 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:156

JCR Journal Grade:1

Cited Count:

WoS CC Cited Count: 27

SCOPUS Cited Count: 33

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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