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Author:

Zhang, L. (Zhang, L..) | Cui, B. (Cui, B..) | Gao, X. (Gao, X..) | Li, M. (Li, M..) (Scholars:栗觅) | Guo, W. (Guo, W..) | Wang, J. (Wang, J..) | Wang, R. (Wang, R..) | Shen, G. (Shen, G..)

Indexed by:

Scopus PKU CSCD

Abstract:

A new structure of transverse micro-stack semiconductor laser bars is put forward to improve the output optical power of semiconductor laser bars at low injection current, which can effectively lessen the thermal damage and catastrophic optical damage (COD). Micro-stack tunnel regeneration tri-active regions laser diode bars are fabricated. Experiments show that the output optical power is 79.3 W and slope efficiency exceeds 1.81 W/A under 50 A driving current, which is two times of that of the traditional single-active bars.

Keyword:

Laser diode bars; Laser technique; Thermal characteristic; Transient temperature

Author Community:

  • [ 1 ] [Zhang, L.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 2 ] [Cui, B.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 3 ] [Gao, X.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 4 ] [Li, M.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 5 ] [Guo, W.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China
  • [ 6 ] [Wang, J.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 7 ] [Wang, R.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China
  • [ 8 ] [Shen, G.]Opto-Electronic Technology Laboratory, Beijing University of Technology, Beijing 100022, China

Reprint Author's Address:

  • [Zhang, L.]Beijing Institute of Tracking and Telecommunication Technology, Beijing 100094, China

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Source :

Semiconductor Optoelectronics

ISSN: 1001-5868

Year: 2010

Issue: 1

Volume: 31

Page: 20-22,100

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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