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Author:

Chu, Zhongyi (Chu, Zhongyi.) | Di, Jingnan (Di, Jingnan.) | Cui, Jing (Cui, Jing.) (Scholars:崔晶)

Indexed by:

EI Scopus SCIE

Abstract:

Space debris occupies a valuable orbital resource and is an inevitable and urgent problem, especially for large space debris because of its high risk and the possible crippling effects of a collision. Space debris has attracted much attention in recent years. A tethered system used in an active debris removal scenario is a promising method to de-orbit large debris in a safe manner. In a tethered system, the flexibility of the tether used in debris removal can possibly induce tangling, which is dangerous and should be avoided. In particular, attachment point bias due to capture error can significantly affect the motion of debris relative to the tether and increase the tangling risk. Hence, in this paper, the effect of attachment point bias on the tethered system is studied based on a dynamic model established based on a Newtonian approach. Next, a safety metric of avoiding a tangle when a tether is tensioned with attachment point bias is designed to analyse the tangling risk of the tethered system. Finally, several numerical cases are established and simulated to validate the effects of attachment point bias on a space tethered system.

Keyword:

Attachment point bias Space debris removal Effect analysis Space tethered system

Author Community:

  • [ 1 ] [Chu, Zhongyi]Beihang Univ, Sch Instrumental Sci & Optoelect Engn, Beijing 100191, Peoples R China
  • [ 2 ] [Di, Jingnan]Beihang Univ, Sch Instrumental Sci & Optoelect Engn, Beijing 100191, Peoples R China
  • [ 3 ] [Cui, Jing]Beijing Univ Technol, Sch Mech Engn & Appl Elect, Beijing 101100, Peoples R China

Reprint Author's Address:

  • [Chu, Zhongyi]Beihang Univ, Sch Instrumental Sci & Optoelect Engn, Beijing 100191, Peoples R China

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Source :

ACTA ASTRONAUTICA

ISSN: 0094-5765

Year: 2017

Volume: 139

Page: 34-41

3 . 5 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:165

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 20

SCOPUS Cited Count: 22

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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