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Author:

Fu, S. (Fu, S..) | Yang, W. (Yang, W..) | Guo, W. (Guo, W..) | Chen, J. (Chen, J..) | Huang, H. (Huang, H..) (Scholars:黄晖)

Indexed by:

Scopus PKU CSCD

Abstract:

GaN-based white light-emitting diodes (LED) were applied with bias of -1600, -1200, -800, -400, 400, 800, 1200 and 1600 V electrostatic discharge in human body mode. The electrical and optical parameters of LED were measured before and after electrostatic discharge, and the influence of static electricity on the reliability of LEDs was theoretically analyed. Experimental results show that: the I-V characteristic curve and the optical parameters of the LED samples are impacted greatly by the reverse electrostatic blow, while little affected by the positive electrostatic blow. It is deduced that secondary defects and melting channel appear inside the chip after reverse electrostatic blow, inducing the change of I-V characteristic curve, the reduce of luminous flux, and accelerated decay rate. In the range of 0~1600 V, the LED reliability depends very little on the positive electrostatic discharge.

Keyword:

Electrostatic; LED; Reliability

Author Community:

  • [ 1 ] [Fu, S.]School of Physics and Electronic Technology, Hubei University, Wuhan 430062, China
  • [ 2 ] [Yang, W.]School of Physics and Electronic Technology, Hubei University, Wuhan 430062, China
  • [ 3 ] [Guo, W.]Beijing Optoelectronic Technology Lab., Beijing University of Technology, Beijing 100022, China
  • [ 4 ] [Chen, J.]Beijing Optoelectronic Technology Lab., Beijing University of Technology, Beijing 100022, China
  • [ 5 ] [Huang, H.]School of Physics and Electronic Technology, Hubei University, Wuhan 430062, China

Reprint Author's Address:

  • [Fu, S.]School of Physics and Electronic Technology, Hubei University, Wuhan 430062, China

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Source :

Semiconductor Optoelectronics

ISSN: 1001-5868

Year: 2013

Issue: 4

Volume: 34

Page: 580-582

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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