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Author:

Wang, H. (Wang, H..) | Wang, J.-S. (Wang, J.-S..) (Scholars:王金淑) | Li, C. (Li, C..) | Li, H.-Y. (Li, H.-Y..) (Scholars:李洪义)

Indexed by:

Scopus PKU CSCD

Abstract:

The crystalline titanium films on conductive glass (FTO) with columnar structure were prepared by using DC magnetron sputtering approach in this paper. The influences of the sputtering current and substrate temperature on microstructure of titanium films were investigated. The impacts of columnar crystalline structure on the structural morphology of TiO2 nanotubes via anodization were also analysised. The morphology and structure of the samples were identified by means of field emission scanning electron microscope (FE-SEM) and X-ray diffractometry (XRD). It is found that, with the sputtering current increasing, the grain size of titanium film increases, but the denseness increases at first, and then decreases. Both grain size and the denseness of titanium films increase with the temperature from 300°C to 450°C, and the columnar structure become more uniform. The anodization process is applied to the sputter-deposited titanium film and the results show that titanium films which have compact columnar crystalline structure are benefitial for the growth of TiO2 nanotubes.

Keyword:

Anodic oxidation; DC magnetron sputtering; Ti thin films; TiO2 nanotube arrays

Author Community:

  • [ 1 ] [Wang, H.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 2 ] [Wang, J.-S.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China
  • [ 3 ] [Li, C.]Beijing Institute of Space Machine and Electricity, China Academy of Space Technology, Beijing 100076, China
  • [ 4 ] [Li, H.-Y.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China

Reprint Author's Address:

  • [Wang, H.]College of Materials Science and Engineering, Beijing University of Technology, Beijing 100124, China

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Source :

Journal of Beijing University of Technology

ISSN: 0254-0037

Year: 2013

Issue: 2

Volume: 39

Page: 263-268

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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