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Author:

Li, Nan (Li, Nan.) | Cao, Mingchen (Cao, Mingchen.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.) (Scholars:吴斌) | Jiao, Jingpin (Jiao, Jingpin.) (Scholars:焦敬品) | Yang, Xiangdong (Yang, Xiangdong.)

Indexed by:

EI Scopus SCIE

Abstract:

Electrical capacitance tomography (ECT) is a non-invasive multiphase flow detecting technique. Sensor optimal design, which is multi-parametric with multiple indicators, is one of the key parts of the ECT technique. In this paper, an enhanced objective function-combination fuzzy index of the ECT (CFIECT) is defined and presented as a multi-parametric indicator for the optimization of the sensor for paraffin deposition detection. In order to evaluate the effectiveness of the CFIECT and optimize the sensor structure, uniformity index P-c nu and image error I-er were set as the single optimization objectives, respectively. A L-9(3(4)) orthogonal design was applied to analyze the weight of the three structural parameters during the sensor design (electrode length, electrode width, and the number of sensor electrodes), which significantly increased the efficiency of the experiments. A semi-normal distribution was selected to characterize the change trend of the CFIECT. Finally, a comparison was proposed. The experimental results indicated that the sensor structure optimized with the CFIECT could derive a greater sensitivity distribution and a better imaging reconstruction results simultaneously. It provides a new optimization method for ECT sensor designs.

Keyword:

multi-parametric indicator Electrical capacitance tomography optimization uniformity index image error

Author Community:

  • [ 1 ] [Li, Nan]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 2 ] [Cao, Mingchen]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 3 ] [He, Cunfu]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 4 ] [Wu, Bin]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 5 ] [Jiao, Jingpin]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 6 ] [Yang, Xiangdong]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China
  • [ 7 ] [Li, Nan]Northwestern Polytech Univ, Sch Automat, Xian 710071, Peoples R China
  • [ 8 ] [Cao, Mingchen]Case Western Reserve Univ, Dept Mech & Aerosp Engn, Cleveland, OH 44106 USA
  • [ 9 ] [Yang, Xiangdong]BAIC MOTOR, Qual Dept, Beijing 101300, Peoples R China

Reprint Author's Address:

  • [Li, Nan]Beijing Univ Technol, Beijing Engn Res Ctr Precis Measurement Technol &, Beijing 100124, Peoples R China;;[Li, Nan]Northwestern Polytech Univ, Sch Automat, Xian 710071, Peoples R China

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Source :

IEEE SENSORS JOURNAL

ISSN: 1530-437X

Year: 2017

Issue: 7

Volume: 17

Page: 2074-2088

4 . 3 0 0

JCR@2022

ESI Discipline: ENGINEERING;

ESI HC Threshold:165

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 18

SCOPUS Cited Count: 28

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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