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作者:

Zheng, Kun (Zheng, Kun.) (学者:郑坤) | Zhang, Zhi (Zhang, Zhi.) | Hu, Yibin (Hu, Yibin.) | Chen, Pingping (Chen, Pingping.) | Lu, Wei (Lu, Wei.) | Drennan, John (Drennan, John.) | Han, Xiaodong (Han, Xiaodong.) (学者:韩晓东) | Zou, Jin (Zou, Jin.)

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摘要:

Understanding the electrical properties of defect-free nanowires with so different structures and their responses under deformation are essential for design and applications of nanodevices and strain engineering. In this study, defect-free zinc-blende- and wurtzite-structured InAs nanowires were grown using molecular beam epitaxy, and individual nanowires with different structures and orientations were carefully selected and their electrical properties and electromechanical responses were investigated using an electrical probing system inside a transmission. electron microscope. Through our careful experimental design and detailed analyses, we uncovered several extraordinary physical phenomena, such as the electromechanical characteristics are dominated by the nanowire orientation, rather than its crystal structure. Our results provide critical insights into different responses induced by deformation of InAs with different structures, which is important for nanowire-based devices.

关键词:

deformation electron transmission microscope InAs nanowires electrical properties

作者机构:

  • [ 1 ] [Zheng, Kun]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 2 ] [Han, Xiaodong]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China
  • [ 3 ] [Zheng, Kun]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 4 ] [Drennan, John]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 5 ] [Zou, Jin]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia
  • [ 6 ] [Zheng, Kun]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia
  • [ 7 ] [Drennan, John]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia
  • [ 8 ] [Zhang, Zhi]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia
  • [ 9 ] [Zou, Jin]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia
  • [ 10 ] [Hu, Yibin]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China
  • [ 11 ] [Chen, Pingping]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China
  • [ 12 ] [Lu, Wei]Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, 500 Yu Tian Rd, Shanghai 200083, Peoples R China

通讯作者信息:

  • 郑坤

    [Zheng, Kun]Beijing Univ Technol, Inst Microstruct & Properties Adv Mat, Beijing Key Lab Microstruct & Property Adv Mat, Beijing 100124, Peoples R China;;[Zheng, Kun]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia;;[Zou, Jin]Univ Queensland, Ctr Microscopy & Microanal, St Lucia, Qld 4072, Australia;;[Zheng, Kun]Univ Queensland, Australian Inst Bioengn & Nanotechnol, St Lucia, Qld 4072, Australia;;[Zou, Jin]Univ Queensland, Mat Engn, St Lucia, Qld 4072, Australia

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来源 :

NANO LETTERS

ISSN: 1530-6984

年份: 2016

期: 3

卷: 16

页码: 1787-1793

1 0 . 8 0 0

JCR@2022

ESI学科: PHYSICS;

ESI高被引阀值:175

中科院分区:1

被引次数:

WoS核心集被引频次: 30

SCOPUS被引频次: 29

ESI高被引论文在榜: 0 展开所有

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