The　temperature　dependences　of　forward　voltage　drop　(V-F)　of　the　fast　recovery　diodes　(FRDs)　are　remarkably　influenced　by　different　lifetime　controlled　treatments.　In　this　paper　the　results　of　an　experimental　study　are　presented,　which　are　the　lifetime　controls　of　platinum　treatment,　electron　irradiation　treatment,　and　the　combined　treatment　of　the　above　ones.　Based　on　deep　level　transient　spectroscopy　(DLTS)　measurements,　a　new　level　E6　(E-C-0.376　eV)　is　found　in　the　combined　lifetime　treated　(CLT)　sample,　which　is　different　from　the　levels　of　the　individual　platinum　and　electron　irradiation　ones.　Comparing　the　tested　VF　results　of　CLT　samples　with　the　others,　the　level　E6　is　responsible　for　the　degradation　of　temperature　dependence　of　the　forward　voltage　drop　in　the　FRD.