A　thorough　study　of　the　growth　and　characterization　of　La2Zr2O7　(LZO)　buffer　layers　prepared　by　chemical　solution　deposition　on　Ni-5　at%　W　biaxially　textured　substrates　is　presented.　The　main　focus　is　to　understand　the　processes　of　film　growth,　texture　evolution,　and　lattice　misorientation　during　heat　treatment　to　obtain　biaxially　textured　LZO　buffer　layers　with　a　high　degree　of　texture.　We　report　a　systematic　investigation　of　LZO　film　growth　with　varying　cation　concentrations　and　processing　temperatures.　45　rotated　misorientation　crystallization　is　found　to　coexist　with　the　cube-on-cube　orientation　and　maybe　partially　formed　by　the　transformation　of　the　cube-on-cube　orientation　with　increasing　annealing　temperature.　The　texture　component　improves　with　increasing　surface　crystallinity.　These　epitaxially　grown　LZO　buffer　layers　have　a　dense　and　smooth　structure　and　a　texture　component　of　98-99%.　(C)　2015　Elsevier　Ltd　and　Techna　Group　S.r.l.　All　rights　reserved.