A　major　revolution　for　electron　microscopy　in　the　past　decade　is　the　introduction　of　aberration　correction,　which　enables　one　to　increase　both　the　spatial　resolution　and　the　energy　resolution　to　the　optical　limit.　Aberration　correction　has　contributed　significantly　to　the　imaging　at　low　operating　voltages.　This　is　crucial　for　carbon-based　nanomaterials　which　are　sensitive　to　electron　irradiation.　The　research　of　carbon　nanomaterials　and　nanohybrids,　in　particular　the　fundamental　understanding　of　defects　and　interfaces,　can　now　be　carried　out　in　unprecedented　detail　by　aberration-corrected　transmission　electron　microscopy　(AC-TEM).　This　review　discusses　new　possibilities　and　limits　of　AC-TEM　at　low　voltage,　including　the　structural　imaging　at　atomic　resolution,　in　three　dimensions　and　spectroscopic　investigation　of　chemistry　and　bonding.　In　situ　TEM　of　carbon-based　nanomaterials　is　discussed　and　illustrated　through　recent　reports　with　particular　emphasis　on　the　underlying　physics　of　interactions　between　electrons　and　carbon　atoms.