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作者:

Zhu, Yongxin (Zhu, Yongxin.) | Li, Xiaoyan (Li, Xiaoyan.) | Gao, Ruiting (Gao, Ruiting.)

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EI Scopus SCIE

摘要:

In this work, stress relaxation behavior of Sn3.5Ag0.5Cu solder joint was investigated under 398 K. Three strain ranges (4, 6, and 8 %) and two strain rates (0.002 and 0.01/s) were utilized. The results show that the effect of strain range on stress relaxation is not significant under high strain rate. However, it firstly increases with strain range and then decreases after approaching the maximum value under low strain rate. Moreover, Stress relaxes more under high strain rate than that under low strain rate. Feltham equation can describe the stress relaxation behavior well under high strain rate. After a certain relaxation time, crack appears at the corner of the solder joint and the stress appears to increase a little.

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作者机构:

  • [ 1 ] [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 2 ] [Li, Xiaoyan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 3 ] [Gao, Ruiting]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China

通讯作者信息:

  • [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100024, Peoples R China

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来源 :

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN: 0957-4522

年份: 2015

期: 5

卷: 26

页码: 3020-3024

2 . 8 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:224

JCR分区:2

中科院分区:3

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WoS核心集被引频次: 0

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ESI高被引论文在榜: 0 展开所有

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