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作者:

Zhu, Yongxin (Zhu, Yongxin.) | Li, Xiaoyan (Li, Xiaoyan.) | Gao, Ruiting (Gao, Ruiting.) | Wang, Chao (Wang, Chao.)

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EI Scopus SCIE

摘要:

In this study, low-cycle fatigue test was conducted for a lead-free solder joint at two test temperatures (348 K, 398 K) and three strain amplitudes (3%, 4%, and 8%). Fatigue failure behavior was analyzed and the fatigue life was evaluated using the Coffin-Manson relationship and Morrow energy-based model. The results show that the maximum load gradually drops with increasing the number of loading cycles. When the strain range or temperature is low, the maximum load drop curve can be divided into three stages. Then, it degrades into a linear stage with increasing the strain range or temperature. Both the softening of solder and the reduction of effective load-bearing area are responsible for the maximum load drop depending on the test condition. Fatigue crack initiates at the corner of the solder joint and propagates along the strain concentrated zone. Spacing distance between fatigue striations is enlarged with increasing the temperature in accordance with the degradation of fatigue resistance. In addition, both the Coffin-Manson model and Morrow energy-based model can be used to evaluate the fatigue life of solder joint under high temperature. The fatigue ductility exponent cc in Coffin-Manson model and the fatigue ductility coefficient C in Morrow model are dependent on temperature, whereas other parameters in these two models keep stable under different temperature. (C) 2014 Elsevier Ltd. All rights reserved.

关键词:

Fatigue failure High temperature Life prediction Solder joint

作者机构:

  • [ 1 ] [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 2 ] [Li, Xiaoyan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 3 ] [Gao, Ruiting]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 4 ] [Wang, Chao]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China

通讯作者信息:

  • [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100024, Peoples R China

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来源 :

MICROELECTRONICS RELIABILITY

ISSN: 0026-2714

年份: 2014

期: 12

卷: 54

页码: 2922-2928

1 . 6 0 0

JCR@2022

ESI学科: ENGINEERING;

ESI高被引阀值:123

JCR分区:2

中科院分区:3

被引次数:

WoS核心集被引频次: 25

SCOPUS被引频次: 29

ESI高被引论文在榜: 0 展开所有

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