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作者:

Zhu, Yongxin (Zhu, Yongxin.) | Li, Xiaoyan (Li, Xiaoyan.) | Wang, Chao (Wang, Chao.) | Gao, Ruiting (Gao, Ruiting.)

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EI Scopus SCIE

摘要:

In this paper, high temperature mechanical fatigue tests on SnAgCu/Cu solder joints were carried out under three test temperatures (100, 125, 150 A degrees C). Failure mechanism was analyzed through observation of micro-crack evolution and fracture morphology. The results show that the deformation curve of solder joint under high temperature mechanical fatigue tests can be divided into three stages: strain hardening stage, stable deformation stage and accelerated failure stage, which is similar to the curve under creep test condition. In addition, the cyclic life decreases rapidly with increasing temperature. Deformation field in the solder joint is non-uniform and shear strain concentration occurs in solder close to the intermetallic compound (IMC) layer. Micro-crack initiates at the corner of the solder joint and then tend to propagate along interface between Cu substrate and solder. The fracture morphology under three temperatures all exhibits ductile fracture mode and the failure path transforms from cutting through the top of Cu6Sn5 to propagation in solder matrix close to IMC layer with increasing temperature.

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作者机构:

  • [ 1 ] [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 2 ] [Li, Xiaoyan]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 3 ] [Wang, Chao]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China
  • [ 4 ] [Gao, Ruiting]Beijing Univ Technol, Sch Mat Sci & Engn, Beijing 100024, Peoples R China

通讯作者信息:

  • [Zhu, Yongxin]Beijing Univ Technol, Sch Mat Sci & Engn, 100 Ping Le Yuan, Beijing 100024, Peoples R China

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来源 :

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS

ISSN: 0957-4522

年份: 2014

期: 3

卷: 25

页码: 1429-1434

2 . 8 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:341

JCR分区:2

中科院分区:3

被引次数:

WoS核心集被引频次: 12

SCOPUS被引频次: 14

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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