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作者:

Bai, Shi (Bai, Shi.) | Zhou, Weiping (Zhou, Weiping.) | Tao, Chen (Tao, Chen.) | Oakes, Ken D. (Oakes, Ken D..) | Hu, Anming (Hu, Anming.)

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EI Scopus SCIE

摘要:

Surface-enhanced Raman spectroscopy (SERS) is rapidly emerging as a powerful analytical tool for trace analysis of metallic substrates. While innovative numerical applications of SERS have been developed, it is still a challenge to fabricate cost-effective and reproducible metallic substrates for SERS probes. Laser processing, especially using ultrafast pulsed laser, can address this issue owing to their high quality processing. Herein, we investigate critical technical requirements and the latest advancements in laser-processing substrates for SERS, while highlighting several diverse applications. In light of its powerful enhancement of Raman scattering, SERS will remain an exciting research area for highly sensitive, resolved analysis into the foreseeable future.

关键词:

Enhancement factor laser interference laser processing metal nanostructure Raman scattering surface enhancement

作者机构:

  • [ 1 ] [Bai, Shi]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 2 ] [Zhou, Weiping]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 3 ] [Tao, Chen]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 4 ] [Hu, Anming]Beijing Univ Technol, Inst Laser Engn, Beijing 100022, Peoples R China
  • [ 5 ] [Oakes, Ken D.]Cape Breton Univ, Dept Biol, Verschuren Ctr, Sydney, NSW B1P 6L2, Australia

通讯作者信息:

  • [Hu, Anming]Beijing Univ Technol, Inst Laser Engn, 100 Pingle Yuan, Beijing 100022, Peoples R China

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来源 :

CURRENT NANOSCIENCE

ISSN: 1573-4137

年份: 2014

期: 4

卷: 10

页码: 486-496

1 . 5 0 0

JCR@2022

ESI学科: MATERIALS SCIENCE;

ESI高被引阀值:256

JCR分区:3

中科院分区:3

被引次数:

WoS核心集被引频次: 13

SCOPUS被引频次: 14

ESI高被引论文在榜: 0 展开所有

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中文被引频次:

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