For　avoiding　the　invalid　acceleration　experiments　caused　by　the　changes　of　the　failure　mechanism,　the　relationship　of　the　failure　mechanism　consistency　and　the　parameters　of　degradation　data　distribution　in　the　early　stage　under　different　accelerated　stress　levels　has　been　derived.　Conditions　for　judging　the　failure　mechanism　consistency　are　also　given　as　follows:　firstly,　the　shape　parameters　of　failure　distribution　has　a　uniform　distribution　m(i)　=　m,　i　=　1,2,3,　.　.　.　;　secondly,　the　dimension　parameter　eta(i)　follows　the　equation　eta(i)　=　AF(i).eta.　A　method　to　rapidly　discriminate　the　consistency　of　failure　mechanism　under　different　experimental　stresses　in　the　early　stage　was　obtained,　and　the　invalid　acceleration　experiments　caused　by　the　changes　of　the　failure　mechanism　could　be　avoided.　Finally,　theoretical　degenerate　data　in　the　early　stage　of　the　accelerated　test　and　the　initial　degenerate　data　of　the　MCM　thick-film　resistor　were　used　for　estimating,　Weibull　distribution　parameter,　and　the　consistency　of　failure　mechanism　degradation　was　also　judged.