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作者:

Wei Xiao-Lin (Wei Xiao-Lin.) | Chen Yuan-Ping (Chen Yuan-Ping.) | Wang Ru-Zhi (Wang Ru-Zhi.) (学者:王如志) | Zhong Jian-Xin (Zhong Jian-Xin.)

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EI Scopus SCIE PKU CSCD

摘要:

In practical applications of graphene-based electronic devices, they may have some pore defects under energetic particle bombardment, or chemical corrosion, which will inevitably affect their electrical properties. These problems have recently aroused great concern and interest. In this paper, we systematically study the influence of shape (tripartite, tetragonal and hexagonal) of hole defect on the electrical property of zigzag graphene nanoribbon (ZGNR). The results show that the influence of the shape of the pore defects on the conductance and current characteristics of ZGNRs is significant, whicl may result from electron scattering for the different shapes of the poredefect boundary. In addition, due to defects in suspension adsorbed hydrogen or nitrogen atoms, caused by defects of the pore shape changes, it also affects the electrical properties of ZGNRs. This study will supply valuable theoretical guidances for graphene-based electronic device failure analysis and the design of the graphene pore structure.

关键词:

pore defects electrical properties graphene

作者机构:

  • [ 1 ] [Wei Xiao-Lin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 2 ] [Chen Yuan-Ping]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 3 ] [Zhong Jian-Xin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China
  • [ 4 ] [Wang Ru-Zhi]Beijing Univ Technol, Coll Mat Sci & Engn, Lab Thin Film Mat, Beijing 100124, Peoples R China

通讯作者信息:

  • [Wei Xiao-Lin]Xiangtan Univ, Dept Phys, Lab Quantum Engn & Micronano Energy Technol, Xiangtan 411105, Hunan, Peoples R China

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来源 :

ACTA PHYSICA SINICA

ISSN: 1000-3290

年份: 2013

期: 5

卷: 62

1 . 0 0 0

JCR@2022

ESI学科: PHYSICS;

JCR分区:3

中科院分区:4

被引次数:

WoS核心集被引频次: 2

SCOPUS被引频次: 4

ESI高被引论文在榜: 0 展开所有

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