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Author:

Jiao, Jingpin (Jiao, Jingpin.) (Scholars:焦敬品) | Liu, Wenhua (Liu, Wenhua.) | Zhang, Jie (Zhang, Jie.) | Zhang, Qiang (Zhang, Qiang.) | He, Cunfu (He, Cunfu.) (Scholars:何存富) | Wu, Bin (Wu, Bin.)

Indexed by:

EI Scopus SCIE

Abstract:

Lubricant film thickness is one of the most important parameters to indicate the operating condition of machine elements, such as mechanical seals and hydrostatic slideway. When ultrasonic waves illuminate the interfaces between the substrates and a lubricant film, it will be reflected due to the change of the material properties at the interfaces. These reflected ultrasonic waves contain information about film thickness. In this paper, wavelet transform modulus maximum method was explored to extract the film thickness from its reflection ultrasonic signals. The performance of different wavelet functions within various scale factors was experimentally investigated, and the optimal wavelet function with the optimal scale factor was pointed out. It has been shown that the measurement error is less than 5% when the thickness of liquid layer is within a certain range. (c) 2012 Elsevier Ltd. All rights reserved.

Keyword:

Modulus maxima Wavelet transform Thickness measurement Liquid layer Ultrasonic technique

Author Community:

  • [ 1 ] [Jiao, Jingpin]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Liu, Wenhua]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Zhang, Qiang]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China
  • [ 4 ] [He, Cunfu]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China
  • [ 5 ] [Wu, Bin]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China
  • [ 6 ] [Zhang, Jie]Univ Bristol, Dept Mech Engn, Bristol BS8 1TR, Avon, England

Reprint Author's Address:

  • 焦敬品

    [Jiao, Jingpin]Beijing Univ Technol, Dept Mech Engn, Beijing 100124, Peoples R China

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Source :

MECHANICAL SYSTEMS AND SIGNAL PROCESSING

ISSN: 0888-3270

Year: 2013

Issue: 1-2

Volume: 35

Page: 69-83

8 . 4 0 0

JCR@2022

ESI Discipline: ENGINEERING;

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 22

SCOPUS Cited Count: 26

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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