The　electron　field　emission　(EFE)　properties　of　nitrogenated　carbon　nanotips　(NCNTPs)　were　studied　under　high-vacuum　conditions.　The　NCNTPs　were　prepared　in　a　plasma-assisted　hot　filament　chemical　vapor　deposition　system　using　CH4　and　N-2　as　the　carbon　and　nitrogen　sources,　respectively.　The　work　functions　of　NCNTPs　were　measured　using　x-ray　photoelectron　spectroscopy.　The　morphological　and　structural　properties　of　NCNTPs　were　studied　by　field　emission　scanning　electron　microscopy,　micro-Raman　spectroscopy,　and　x-ray　photoelectron　spectroscopy.　The　field　enhancement　factors　of　NCNTPs　were　calculated　using　relevant　EFE　models　based　on　the　Fowler-Nordheim　approximation.　Analytical　characterization　and　modeling　results　were　used　to　establish　the　relations　between　the　EFE　properties　of　NCNTPs　and　their　morphology,　structure,　and　composition.　It　is　shown　that　the　EFE　properties　of　NCNTPs　can　be　enhanced　by　the　reduction　of　oxygen　termination　on　the　surface　as　well　as　by　increasing　the　ratio　of　the　NCNTP　height　to　the　radius　of　curvature　at　its　top.　These　results　also　suggest　that　a　significant　amount　of　electrons　is　emitted　from　other　surface　areas　besides　the　NCNTP　tops,　contrary　to　the　common　belief.　The　outcomes　of　this　study　advance　our　knowledge　on　the　electron　emission　properties　of　carbon　nanomaterials　and　contribute　to　the　development　of　the　next-generation　of　advanced　applications　in　the　fields　of　micro-　and　opto-electronics.　(C)　2012　American　Institute　of　Physics.　[http://dx.doi.org/10.1063/1.4759047]