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JEM 2100透射电镜照相系统故障分析
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Translated Title
Problems Analysis on Camera Systems of JEM 2100 Transmission Electron Microscope
Translated Abstract
Translated Keyword
problems analysiscamera systemstransmission electron microscope
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TH774
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WF:perioarticalQK201003119484
Language
Chinese
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Source :
理化检验(物理分册)
ISSN: 1001-4012
Year: 2010
Issue: 011
Page: 710-711,722
Cited Count:
WoS CC Cited Count: 0
SCOPUS Cited Count:
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count: -1
Chinese Cited Count:
30 Days PV: 5
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