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作者:

Guo Chun-Sheng (Guo Chun-Sheng.) | Shan Ni-Na (Shan Ni-Na.) | Feng Shi-Wei (Feng Shi-Wei.) (学者:冯士维) | Ma Wei-Dong (Ma Wei-Dong.)

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Scopus SCIE PKU CSCD

摘要:

To correct the error in theoretical model of process stress accelerated test, a new calculation method is proposed The new method, based on computer-aided calculation, can significantly reduce the error of the model Theoretical data is calculated using both the novel model algorithm, which is the root test method, and the old model algorithm The results shows that the old model algorithm can generate errors of more than 13% m the activation energy, and of errors more than 150% in the extrapolated lifetimes (Q <= 1.0 ev), while the novel model algorithm generates errors in less than 1% in activation energy, and errors less than -4.1% in the extrapolated lifetime

关键词:

accelerated test error correction process-stress theory model

作者机构:

  • [ 1 ] [Guo Chun-Sheng]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 2 ] [Shan Ni-Na]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 3 ] [Feng Shi-Wei]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China
  • [ 4 ] [Ma Wei-Dong]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China

通讯作者信息:

  • [Guo Chun-Sheng]Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing 100124, Peoples R China

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来源 :

ACTA PHYSICA SINICA

ISSN: 1000-3290

年份: 2010

期: 4

卷: 59

页码: 2350-2355

1 . 0 0 0

JCR@2022

ESI学科: PHYSICS;

JCR分区:2

中科院分区:4

被引次数:

WoS核心集被引频次: 1

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