Thin,　biaxially　textured　Ni5W/Ni12W/Ni5W　composite　substrates　for　coated　conductor　applications　have　been　fabricated.　The　particularity　of　this　three-layer　composite　configuration　resides　in　the　elemental　diffusion　between　the　outer　layer　and　the　core　layer.　Due　to　the　migration　of　elemental　W,　the　diffusion　layer　in　the　as-annealed　substrate　becomes　broader　than　that　of　the　as-rolled　substrate.　The　obtained　tape　has　a　sharp　cubic　texture　on　the　Ni5W　outer　layers,　and　the　volume　fraction　of　cubic　grains　exceeds　98.8%　(＜10　degrees)　at　the　outer　surfaces.　In　situ　electron　backscatter　diffraction　strain-stress　analysis　shows　that　the　high-quality　cubic　texture　was　stable　until　elongations　as　high　as　2%.　The　yield　strength　of　the　composite　substrate　approaches　240　MPa　and　its　saturation　magnetization　at　77　K　has　been　strongly　reduced　with　respect　to　pure　Ni　and　Ni5W　substrates.　The　present　results　demonstrate　that　this　advanced　three-layer　substrate　is　suitable　for　the　epitaxial　growth　of　the　LZO　buffer　layers.　(C)　2009　Acta　Materialia　Inc.　Published　by　Elsevier　Ltd.　All　rights　reserved.