Waveguided　grating　structures　were　fabricated　using　interference　lithography.　The　angle　resolved　tuning　properties　of　the　resonant　waveguide　mode　and　its　dependence　on　the　grating　parameters　and　on　the　polarization　properties　of　the　incident　light　were　investigated.　In　particular,　the　influence　of　the　grating　period　and　waveguide　thickness　on　the　tuning　rate　of　the　resonance　waveguide　mode　was　charatcerized.　Theoretical　simulation　showed　good　agreement　with　the　experimental　results,　which　is　important　for　futher　applications　of　the　waveguided　grating　device　in　filters　and　sensors.