英文标题
Structural characterization of Zn-polar ZnO films grown on Mg-modified c-Al2O3 (0001) surface
英文摘要
The structure of the ZnO films grown on (0001) sapphire using surface modification of magnesium pre-exposure has been investigated by high resolution transmission electron microscopy, electron holography and X-ray energy dispersive spectroscopy. It is found that pre-deposition of an ultra-thin magnesium film on the sapphire substrate plays a key role in zinc polarity selection and rotation domains elimination of ZnO films. In the resulting sharp interfaces of ZnO/MgO/sapphire, an ordered MgO layer ( ～ 3atomic layers) was observed, which serves as a uniform template for nucleation and growth of a single-domain ZnO film.
翻译关键词
electron holography
polarity
TEM
X-ray
ZnO
分类号
O484.1
TN304.2
O484.5
O76
TN26
TG115.21+5.3
获取号
WF:perioarticaldzxwxb200705004
